One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories

A new probability distribution to study lifetime data in reliability is introduced this paper. This one a first approach non-homogeneous phase-type distribution. It built by considering cut-point the non-negative semi-line of The density function defined and main measures associated, such as function, hazard rate, cumulative rate characteristic are also worked out. class distributions enables us decrease number parameters estimate when inference considered. Additionally, likelihood model maximum likelihood. Several applications Resistive Random Access Memories compare adjustment phase type developed methodology has been computationally implemented R-cran.